DUAN, Ning; LIU, Fengnan; ZHAO, Xiaopeng. Global well-posedness of solutions for the epitaxy thin film growth model. Nonlinear Analysis: Modelling and Control, [S. l.], v. 26, n. 4, p. 565–580, 2021. DOI: 10.15388/namc.2021.26.23936. Disponível em: https://www.journals.vu.lt/nonlinear-analysis/article/view/23936.. Acesso em: 4 may. 2024.